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Sample preparation

SEM imaging using backscattered electrons and X-rays requires a polished specimen for optimum performance [17]. Approximately 25 g of the cement powder are blended with an epoxy resin (Epotek 353ND 1,2 to form an extremely viscous paste. The mixture is pressed into a plastic mold (32 mm diameter) and cured at room temperature for 24 h. The cured specimen is then cut to obtain a plane surface for imaging and saw marks are removed using 600 grit followed by 1200 grit sandpaper. Final polishing is done on a lap wheel with (9, 3, 1, and 0.25) micrometer diamond paste for 120 s each. After each polishing, the specimen is cleaned using a clean polishing cloth. The final polished specimen is coated with carbon to provide a conductive surface for SEM imaging.

1 Certain trade names and products are identified to adequately specify the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it Imply that the products are necessarily the best available for the purpose.
2 Epotek 353 ND, Epoxy Technology, Billerica, MA, http://www.epotek.com.
Next: Image acquisition Up: Scanning electron Previous: Scanning electron