Scanning Electron Microscopy Imaging

The recent application of SEM and X-ray imaging to cement-based materials is summarized in Panel B. Images of the two CCRL cements analyzed in this research using these procedures ire provided in Fig. 2. Tables III and IV compare the measured area and perimeter phase fractions to the phase fractions calculated from the oxide compositions in Table I using the conventional Bogue calculation. ²⁶ For Cement 116, the gypsum area fraction is somewhat high because of the presence of a large gypsum particle in the field of view selected for analysis, as shown in Fig. 2.

Fig. 2. Two-dimensional segmented images of (a-top) Cement 115 and (b-bottom) Cement 116 (C₃S is red, C ₂S is aqua, C₃ is green, C₄ is orange, and gypsum is pale green).