Computer Image Processing

In the Building Materials Division at the National Institute of Standards and Technology, researchers are using computer image processing to provide quantitative characterization of the properties and degradation states of a variety of building materials. Using either a video or an infrared camera, analyses of coatings on steel, metal substrates, and roofing membranes have been performed. When compared to conventional techniques, computer image analysis offers the benefits of higher throughput, quantitative results, and higher reproducibility.

Currently, a government/industry consortium is working on incorporating these techniques into standards, as a large number of industrial companies have already adopted these techniques for use in their laboratories.

Publications

Bentz, D.P., and Martin, J.W., "Using the Computer to Analyze Coating Defects," Journal of Protective Coatings and Linings, Vol. 4 (5), 38-45, 1987.

Martin, J.W., Bentz, D.P., Kaetzel, L.J., and McKnight, M.E., "An Automated Maintenance Management Program Part I: Quantitative Assessment of the Exterior Condition of Metal Buildings and Roofing Systems via Computer Image Processing," NBSIR 88-3719, U.S. Department of Commerce, March 1988.

Kaetzel, L.J., Martin, J.W., and Hocker, M.M., "An Automated Maintenance Management Program Part II: The Integration of Databases and Image Processing Results for the Quantitative Assessment of the Exterior Condition of Metal Buildings," NISTIR 89-4179, U.S. Department of Commerce, September 1989.

McKnight, M.E., and Martin, J.W., "Detection and Quantitative Characterization of Blistering and Corrosion of Coatings on Steel Using Infrared Thermography" Journal of Coatings Technology, Vol. 61 (775), 57-62, 1989.

Bentz, D.P., Martin, J.W., and Batts, M.E., "Characterization of Cylindrical Holes in Metallic Substrates Via Their Infrared Emission Patterns," Wear, Vol. 143, 255-266, 1991.

Bentz, D.P., and Martin, J.W., "Thermographic Imaging of Surface Finish Defects in Coatings on Metal Substrates," Materials Evaluation, Vol. 50 (2), 242-252, 1992.